Accurate alignment of clocks in mixed-signal tester

Details Accurate alignment of clocks in mixed-signal tester Accurate alignment of clocks in mixed-signal tester

1995-08-01

1998-01-20

Wambach, Margaret Rose

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

327149, 327153, 327234, 327296, H03L 700

Patent

active

057105170

ABSTRACT:
Asynchronously-generated digital and analog clocks in a mixed-signal test system are accurately aligned for repeatable and deterministic testing. A variable-frequency digital master clock signal is used in direct digital synthesis of an analog clock signal which is asynchronous to the master clock signal. A resync command inhibits the analog clock signal until the analog clock signal is in a desired phase relationship to the master clock signal. The analog clock signal is thus phase-aligned with the master clock signal in a known and deterministic relationship. The resync command also aligns the phase of the analog clock signal with the pattern of stimulus signals applied to the device under test. Aligning the analog clock signal with the master clock signal and with the stimulus pattern assures that test results are consistent from test-to-test. A phase-locked loop removes spurs from the synthesized analog clock signal. A jitter generator is provided for controlled jittering of the analog clock signal as needed for some types of test. An Nth occurrence counter allows for programmable introduction of an extra master-clock-signal period in the test pattern when needed to avoid creating a metastable condition in the device under test.

REFERENCES:
patent: 4560939 (1985-12-01), Dekarska et al.

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