Geometrical instruments – Distance measuring – Opposed contacts
Patent
1992-12-28
1994-09-13
Fulton, Christopher W.
Geometrical instruments
Distance measuring
Opposed contacts
33826, G01B 502
Patent
active
053456920
ABSTRACT:
Extension standards are provided for outside micrometers and calipers. Sleeves engage the extension standards and the micrometer anvil and/or spindle, or the measuring surfaces of calipers, to selectably position the measuring gap and also to provide different sizes of such measuring gaps at those positions.
REFERENCES:
patent: 1646393 (1927-10-01), De La Mater
patent: 2193939 (1940-03-01), Sanford
patent: 2607999 (1952-08-01), Stedman
patent: 3496758 (1970-02-01), Sunnen
patent: 4077129 (1978-03-01), Nishikata
patent: 4399613 (1983-08-01), Nishikata et al.
Fulton Christopher W.
Shapiro Allan M.
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