Accelerated weathering and lightfastness testing chamber

Measuring and testing – Simulated environment

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356246, G01N 1700

Patent

active

051368862

ABSTRACT:
A lightfastness testing chamber comprises an enclosure for samples being tested and at least one, and preferably a plurality of, lamps for irradiating samples in the enclosure. A monitor of the light intensity from each lamp present is provided. By this invention the monitor may comprise a light transmission rod, and preferably one such rod for each of the lamps, having one end positioned adjacent the lamp and another end in communication with light intensity measuring apparatus positioned more remotely from the lamp than the one end. The light transmission rod is preferably positioned on a side of the lamp that is substantially opposed to portions of the lamp that directly irradiate samples in the enclosure. Also, the samples may be moved by an elevatable platform or the like toward and away from the irradiating lamp or lamps to vary as desired the intensity of irradiation applied to the samples. Both curved and flat reflecting mirrors may be provided above the lamps to provide a desired uniformity of irradiation.

REFERENCES:
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patent: 3713727 (1973-01-01), Markosian et al.
patent: 3797918 (1974-03-01), Kockott
patent: 4760748 (1988-08-01), Katayanagi et al.
patent: 4817447 (1989-04-01), Kashima et al.
patent: 4843893 (1989-07-01), Huber et al.
patent: 4874952 (1989-10-01), Arnaud et al.
patent: 4957011 (1990-09-01), Huber et al.
Brochure entitled SunSystem by Atlas Electric Devices Company of Chicago, Ill.; 4 pages; copyright 2-1988.

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