Accelerated test method and system

Details Accelerated test method and system Accelerated test method and system

2006-03-28

2006-03-28

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S108000

Reexamination Certificate

active

07020570

ABSTRACT:
An accelerated test method for testing an integrated circuit is described. The accelerated test method has the following steps. First, test vector data is taken as input to the integrated circuit to produce response data as output. Next, a one-way-hash function is used to transform the response data into a test message digest. Next, the test message digest is verified against a standard message digest to determine whether the test message digest meet a predetermined requirement. The one-way-hash function is embedded as part of the BIST circuit in the integrated circuit or implemented within automated test equipment.

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