Measuring and testing – Simulated environment
Patent
1990-05-16
1992-08-18
Noland, Tom
Measuring and testing
Simulated environment
374 57, G01N 1700
Patent
active
051388928
ABSTRACT:
A method of carrying out an accelerated light fastness test on a sample of a material to be used under certain conditions of air convection along the surface thereof, is constituted by the steps of positioning a sample to be tested with the surface thereof which is exposed to light during intended conditions of use of the material spaced at a distance from a light source having a constant intensity of light radiated therefrom for causing the surface of the sample to receive a desired intensity of light, and positioning a filter between the surface of the sample and the light source and spaced a distance from the surface of the sample for causing air between the filter and the sample to be at the convection conditions corresponding to the certain conditions of air convection at the surface of the material under its intended conditions of use, whereby the temperature conditions of the material at the surface facing the source of light are made to correspond to the temperature conditions during the intended use of the material.
REFERENCES:
patent: 2523322 (1950-09-01), Ornstein et al.
patent: 3576125 (1971-04-01), Kockott et al.
patent: 3797918 (1974-03-01), Kockott
patent: 4627287 (1986-12-01), Suga
patent: 4634290 (1987-01-01), Roencwaig et al.
patent: 4706903 (1987-11-01), Suga et al.
patent: 4760748 (1988-08-01), Katayanagi et al.
patent: 4807247 (1989-02-01), Robbins, III
patent: 4817447 (1989-04-01), Kashima et al.
patent: 4995273 (1991-02-01), Kisima et al.
Patent Abstracts of Japan; Grp. p. 971, vol. 13, No. 547, Abs. Pub. Date Dec. 7, 1989 (01-227944).
Patent Abstracts of Japan; Grp. p. 282, vol. 8, No. 137, Abs. Pub. Date Jun. 26, 1984 (59-37446).
Noland Tom
Suga Test Instruments Co. Ltd.
LandOfFree
Accelerated light fastness test method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Accelerated light fastness test method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Accelerated light fastness test method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1240420