Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-19
2008-03-25
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07348790
ABSTRACT:
Some embodiments of the invention include apparatus and systems having integrated circuits. Terminals or pins of the integrated circuits are configured to be driven to a state, to be floated for a time interval, and to be measured to determine the state of the terminals after the time interval. The measurement involves sampling the RC time constant of leakage current of the terminals. Other embodiments are described and claimed.
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Arabi Tawfik R.
Elwer Patrick
Murray Dan
Pedarla Srirama
Taylor Gregory F.
Intel Corporation
Nguyen Ha Tran
Schwegman Lundberg & Woessner, P.A.
Vazquez Arleen M.
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