Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-22
2005-11-22
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06967496
ABSTRACT:
A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.
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Arabi Tawfik R.
Elwer Patrick
Murray Dan
Pedaria Srirama
Taylor Gregory F.
Intel Corporation
Kobert Russell M.
Nguyen Vinh
Schwegman Lundberg Woessner & Kluth P.A.
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