AC testing of leakage current in integrated circuits using...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S1540PB

Reexamination Certificate

active

06967496

ABSTRACT:
A method of testing an integrated circuit includes applying a voltage to one of the pins of the integrated circuit. The pin is floated for a predetermined time. A measurement is performed after the predetermined time. The measurement involves sampling the RC time constant of leakage current of the pins.

REFERENCES:
patent: 5519327 (1996-05-01), Consiglio
patent: 5523699 (1996-06-01), Miyagawa
patent: 6255842 (2001-07-01), Hashimoto
patent: 6342790 (2002-01-01), Ferguson et al.
patent: 6448800 (2002-09-01), Yamamoto et al.
patent: 6735706 (2004-05-01), Tomlinson et al.

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