AC interconnect test of integrated circuit chips

Details AC interconnect test of integrated circuit chips AC interconnect test of integrated circuit chips

1993-06-01

1995-08-22

Ramirez, Ellis B.

Excavating

371 221, G01R 3128

Patent

active

054447151

ABSTRACT:
An integrated circuit chip (110) adapted to provide interconnect capability and an AC interconnect test method therefor. Test and control data are scanned in the scan-path of latches (114 and 115) to initialize the AC interconnect test. Subsequently the functional system mode is simulated by applying the functional-system clocks via lines (118 and 128).

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