Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system
Reexamination Certificate
2005-02-15
2005-02-15
Broda, Samuel (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
C703S015000, C703S020000, C703S022000, C714S741000, C714S742000
Reexamination Certificate
active
06856950
ABSTRACT:
A system and method of verifying an electronic system. A verification kernel is provided and the electronic system is expressed as a logic design. A wrapper is defined, wherein the wrapper is an interface between the logic design and the verification kernel. Tests to be run against the logic design are placed within a diagnostic program and an interface between the diagnostic program and the verification kernel is defined. The tests are then executed against the logic design. The results of the tests are captured and validated against expected results.
REFERENCES:
patent: 5732247 (1998-03-01), Dearth et al.
patent: 6167363 (2000-12-01), Stapleton
patent: 6208954 (2001-03-01), Houtchens
Liu et al, “Software Timing Analysis Using HW/SW Cosimulation and Instruction Set Simulator,” IEEE Proceedings of the Sixth International Workshop on Hardware/Software Codesign, pp. 65-69 (Mar. 1998).*
Mascarenhas et al, “ParaSol: A Multithreaded System for Parallel Simulation Based on Mobile Threads,” pp. 690-697 (Dec. 1995).*
“Spec-Based Verification”,Verisity Designs, Inc., http://www.verisity.com/html.specbased.html, pp. 1-17, (1999).
Abts, D., et al., “Verifying Large-Scale Multiprocessore Using an Abstract Verification Environment”,Proceedings of the 36th Annual Design Automation Conference, pp. 1-10, (1999).
Chapiro, D., “The Next Frontier: High-Level Functional Verification”,Integrated Systems Design Magazine, http://www.isdmag.com/Editorial/1997/Viewpoint9704.html, pp. 1-2, (1997).
Eiriksson, A., et al., “Origin System Design Methodology and Experience: 1M-gate ASICs and Beyond”,COMPCON-97, Silicon Graphics, Inc., Mountain View, CA, pp. 1-8, (1997).
Jones, K.D., et al., “The Automatic Generation of Functional Test Vectors for Rambus Design”,Proceedings of the 33rd Annual Design Automation Conference, pp. 415-420, (1996).
Subrahmanyam, P., “Functional verification finds a good friend in Vera”,TechWeb, http://techweb.com/se/directlink.cgi?EET19970609S0083, pp. 1-4, (1997).
Abts Dennis
Roberts Michael
Broda Samuel
Schwegman Lundberg Woessner & Kluth P.A.
Silicon Graphics Inc.
LandOfFree
Abstract verification environment does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Abstract verification environment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Abstract verification environment will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3483099