Absolute reflectometer

Details Absolute reflectometer Absolute reflectometer

1980-11-13

1983-01-18

Arnold, Bruce Y.

Optics: measuring and testing

Of light reflection

G01N 2155

Patent

active

043689833

ABSTRACT:
An apparatus and method to measure the absolute reflectivity of a sample is made by use of a multiple pass reflectometer. A given light beam permits measurement of the absolute reflectivity by comparing a portion of the light beam in a reference White cell to the change in light of another portion of the beam which undergoes equivalent reflections except for the addition of the sample in one configuration as compared to the other.

REFERENCES:
patent: 3160752 (1964-12-01), Bennett
patent: 3402634 (1968-09-01), Bennett
patent: 3421079 (1969-01-01), Bennett et al.
patent: 3499716 (1970-03-01), Bennett
patent: 3771880 (1973-11-01), Bennett
patent: 3947127 (1976-03-01), Bennett et al.
Versatile High-Precision Multiple-Pass Reflectometer by O. Arnon and P. Beister, Applied Optics, vol. 17, No. 18, Sep. 15, 1978.
Scattering Characteristics of Optical Materials by H. E. Bennett, vol. 17, No. 5, Optical Engineering, Sep.-Oct. 1978.

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