Absolute position determination of an object using pattern...

Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position

Reexamination Certificate

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C702S150000

Reexamination Certificate

active

11004759

ABSTRACT:
A contact free optical position sensor for an inertial reference system. An optical sensor is adapted to generate image signals of a gas bearing supported inertial sensor assembly. The surface of the inertial sensor assembly is adapted with a reference surface pattern. A controller is coupled to receive the image signals from the optical sensor and is adapted with an image map of the reference surface pattern stored in a memory means that allows the controller to uniquely correlate an image captured by the optical sensor to an absolute position on the inertial sensor assembly. The controller is further adapted to determine the absolute position and attitude of the inertial sensor assembly based on the correlation between the imaged reference pattern features, the imaged reference pattern's angle of rotation, and the map of the reference pattern.

REFERENCES:
patent: 3039316 (1962-06-01), Slater
patent: 3056303 (1962-10-01), Naylor
patent: 3365942 (1968-01-01), Blazek
patent: 3439546 (1969-04-01), Baker et al.
patent: 3576124 (1971-04-01), O'Connor
patent: 3670585 (1972-06-01), Alexander et al.
patent: 3769710 (1973-11-01), Reister
patent: 3782167 (1974-01-01), Stuelpnagel
patent: 4003265 (1977-01-01), Craig et al.
patent: 4150579 (1979-04-01), Vaughn
patent: 4244215 (1981-01-01), Merhav
patent: 4515486 (1985-05-01), Ide
patent: 4671650 (1987-06-01), Hirzel et al.
patent: 4711125 (1987-12-01), Morrison
patent: 4723735 (1988-02-01), Eisenhaure et al.
patent: 4917330 (1990-04-01), Dulat et al.
patent: 5067084 (1991-11-01), Kau
patent: 5088825 (1992-02-01), Derry et al.
patent: 5099430 (1992-03-01), Hirsch
patent: 5319577 (1994-06-01), Lee
patent: 5357437 (1994-10-01), Polvani
patent: 5396326 (1995-03-01), Knobbe et al.
patent: 5710559 (1998-01-01), Krogmann
patent: 5894323 (1999-04-01), Kain et al.
patent: 6172665 (2001-01-01), Bullister
patent: 6481672 (2002-11-01), Goodzeit et al.
patent: 6594623 (2003-07-01), Wang et al.
patent: 6594911 (2003-07-01), Brunstein et al.
patent: 6629778 (2003-10-01), Enderle et al.
patent: 6741209 (2004-05-01), Lee
patent: 6826478 (2004-11-01), Riewe et al.
patent: 7003399 (2006-02-01), Chappell
patent: 2002/0077189 (2002-06-01), Tuer et al.
patent: 2003/0120425 (2003-06-01), Stanley et al.
patent: 2004/0015323 (2004-01-01), Boyton
patent: 2004/0075737 (2004-04-01), Kirby
patent: 2004/0089083 (2004-05-01), Bailey
patent: 2004/0212803 (2004-10-01), Siegl et al.
patent: 866473 (1961-04-01), None
patent: 878939 (1961-10-01), None
patent: 1015681 (1966-01-01), None
patent: 1284195 (1972-08-01), None
patent: 2166920 (1986-05-01), None
patent: 9505547 (1995-02-01), None
patent: 2004023150 (2004-03-01), None
Benbasat, “An Inertial Measurement Unit for User Interfaces”, Sep. 8, 2000, pp. 1-100, Publisher: Massachusetts Institute of Technology, Published in: Ma, USA.
El-Sheimy et al., “Structural Monitoring Using Wirelessly Connected Mems-Based Snesors-Towards System Development”, Feb. 18, 2003, pp. 1-10, Publisher: ICPCM, Published in: Cairo, Egypt.
IBM Corp., “The Tracking Cube: A Three Dimensional Input Device”, Aug. 1, 1989, pp. 91-95, vol. 32, No. 3B, Publisher: IBM Technical Disclosure Bulletin, Published in: NY, US.
NG, “The Optical Mouse as a Two-Dimensional Displacement Sensor”, “Sensors and Actuators a”, Oct. 1, 2003, pp. 21-25, vol. 107, No. 1, Publisher: Elseveier Sequoia S.A., Published in: Lausanne, Ch.

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