Absolute distance sensor

Details Absolute distance sensor Absolute distance sensor

1983-06-07

1986-09-16

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, G01B 902

Patent

active

046119159

ABSTRACT:
The improved Absolute Distance Sensor has achieved presently a resolution of about 0.03 .mu.m (RMS) for measurements over long distances. A two-color, synthetic Michelson interferometer employing a CO.sub.2 source is designed to sequentially switch between four sets of R and P line pairs and thereby provide a basis for forming simultaneous equations which are employed to greatly reduce the half wavelength ambiguity typical of single wavelength interferometers.

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patent: 4355899 (1982-10-01), Nussmeier
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patent: 4360271 (1982-11-01), Downs et al.
patent: 4492464 (1985-01-01), Bourdet et al.
Bien et al., "Absolute Distance Measurements by Variable Wavelength Interferometry", Applied Optics, vol. 20, No. 3, pp. 400-403, 2/81.
C. W. Gillard et al, "Absolute Distance Interferometry", Optical Engineering, Jan./Feb. 1981, vol. 20, No. 1, pp. 129-134.
C. W. Gillard et al, "Progress in Absolute Distance Interferometry", SPIE, Nov. 82, pp. 1-9.

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