Optics: measuring and testing – Range or remote distance finding – With photodetection
Reexamination Certificate
2008-01-08
2008-01-08
Tarcza, Thomas H. (Department: 3662)
Optics: measuring and testing
Range or remote distance finding
With photodetection
C356S004100, C356S004010
Reexamination Certificate
active
10891138
ABSTRACT:
An external cavity laser has an external cavity that is formed between a target surface and a laser diode facet located farthest from the target surface. A chromatic dispersive element is disposed in the external cavity, and focuses light from the laser diode such that one wavelength is focused at a focal spot on the target surface. Light reflected from the focal spot on the target surface is the predominant wavelength coupled back into the laser waveguide, which provides a feedback signal that determines the oscillation wavelength of the laser diode. The laser diode therefore outputs a well-defined wavelength of light which corresponds to the distance between the chromatic dispersive element and the target surface.
REFERENCES:
patent: 3970389 (1976-07-01), Mendrin et al.
patent: 5377219 (1994-12-01), Geiger
patent: 5790242 (1998-08-01), Stern et al.
patent: A 0997748 (2000-05-01), None
patent: A 2328739 (1999-03-01), None
Franco Quercioli et al.; “Optical Surface Profile Transducer”; Optical Engioneering; Feb. 1988; vol. 27, No. 2, pp. 135-142.
Sarah L. Dobson et al.; “Diffractive lenses for Chromatic Confocal Imaging”; Applied Optics; Jul. 10, 1997; vol. 36, No. 20, pp. 4744-4748.
Zorabedian, Paul et al., “Bistability in Grating-Tuned External-Cavity Semiconductor Lasers,”IEEE Journal of Quantum Electronics, vol. QE-23, No. 11, Nov. 1987, pp. 1855-1860.
Dobson, Sarah et al., “Diffractive lenses for chromatic confocal imaging,”Applied Optics, vol. 36, No. 20, Jul. 10, 1997, pp. 4744-4748.
Braun, David et al., “Broadband multilayer antireflection coating for semiconductor laser facets,”Optics Letters, vol. 20, No. 10, May 15, 1995, pp. 1154-1156.
Mitutoyo Corporation
Oliff & Berridg,e PLC
Ratcliffe Luke D.
Tarcza Thomas H.
LandOfFree
Absolute distance measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Absolute distance measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Absolute distance measuring device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3919024