Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2011-03-01
2011-03-01
A Lee, Hwa S. (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
Reexamination Certificate
active
07898669
ABSTRACT:
The present invention relates to absolute distance measurement method and system using an optical frequency generator. The absolute distance measurement method using the optical frequency generator includes (a) generating a plurality of different stabilized wavelengths by using the optical frequency generator; (b) obtaining an initial estimation value of a distance to be measured by using a frequency sweeping interferometer; (c) analyzing an uncertainty range of the obtained initial estimation value; (d) measuring excess fraction parts of the different wavelengths by analyzing interference signals for each of the wavelengths; (e) determining integer parts for each of the different wavelengths within the uncertainty range of the initial estimation value; and (f) measuring an absolute distance to be measured by using the excess fraction part and the integer parts for each of the different wavelengths.
REFERENCES:
patent: 6646723 (2003-11-01), Dubovitsky et al.
Aspen 2007 Asian Symposium for Precision Engineering and Nanotechnology 2007; Nov. 6-9, 2007; pp. Cover, 4 and 39-41, GIST, Gwangju, Korea.
Korean Society for Precision Engineering KSPE 2007 Autumn Conference (and English translation); Nov. 8-10, 2007; Cover, pp. 1-7, 31-36, 39 and 40.
Kim et al., Young-Jin;A wide-range optical frequency generator based on the frequency comb of a femtosecond laser; Jan. 7, 2008; pp. 258-264; vol. 16, No. 1, Optics Express; Optical Society of America.
Jin Jonghan
Kim Seung Woo
Kim Young Jin
A Lee Hwa S.
Bacon & Thomas PLLC
Korea Advanced Institute of Science and Technology
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