Abnormality diagnostic method and device thereof

Details Abnormality diagnostic method and device thereof Abnormality diagnostic method and device thereof

2007-10-05

2009-08-11

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

Reexamination Certificate

active

07574324

ABSTRACT:
An abnormality diagnostic device selects a previously stored diagnostic measuring orbit (S110), and makes a machine to perform a specified operation for diagnosis so as to measure a driving power value of an actuator (S120). In S140,the abnormality diagnostic device compares the measured driving power value and a driving power value at the time of normal driving, and extracts a non-corresponding portion as a characteristic point based on a previously set determination criteria. When the extracting of the characteristic point is confirmed in S170,the abnormality diagnostic device compares the extracted characteristic point with a characteristic point predicted to occur in a driving power value at a time of occurring abnormality in a mechanism element, and calculates an evaluation index from a corresponding degree of both. When the evaluation index is a threshold value or more in S180,the abnormality diagnostic device estimates a mechanism element having an abnormality in S190.

REFERENCES:
patent: 2008/0039973 (2008-02-01), Ueno et al.
patent: 2008/0140258 (2008-06-01), Ueno et al.
patent: 2008/0215292 (2008-09-01), Kato et al.
patent: 2008/0243434 (2008-10-01), Boutin
patent: 2000-250625 (2000-09-01), None

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