Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2005-10-17
2009-12-29
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S033000, C702S056000, C702S077000, C702S182000, C073S593000, C073S602000, C073S659000, C073S660000
Reexamination Certificate
active
07640139
ABSTRACT:
Provided are an envelope processor103, for obtaining an envelope for a detected signal; a FFT unit104, for converting the envelope into a frequency spectrum; a peak detector105, for smoothing the frequency spectrum by calculating a moving average, for further performing smoothing and differentiation for the spectrum, and detecting, as peaks, frequency points at which a sign of a differential coefficient is changed from positive to negative, for extracting peaks having a predetermined threshold value or greater, and for sorting the extracted peaks and detecting upper peaks; and a diagnosis processor T, for diagnosing an abnormality based on the detected peaks.
REFERENCES:
patent: 5251151 (1993-10-01), Demjanenko et al.
patent: 5365787 (1994-11-01), Hernandez et al.
patent: 6020701 (2000-02-01), Ishida
patent: 6215408 (2001-04-01), Leonard et al.
patent: 6694285 (2004-02-01), Choe et al.
patent: 6747592 (2004-06-01), Nakamura
patent: 6766339 (2004-07-01), Wiener
patent: 2005/0096873 (2005-05-01), Klein
patent: 2-25778 (1990-01-01), None
patent: 2-99368 (1990-08-01), None
patent: 4-52526 (1992-02-01), None
patent: 4-148839 (1992-05-01), None
patent: 4-235327 (1992-08-01), None
patent: 5-142033 (1993-06-01), None
patent: 7-137509 (1995-05-01), None
patent: 8-77683 (1996-03-01), None
patent: 8-179826 (1996-07-01), None
patent: 9-500452 (1997-01-01), None
patent: 9-113416 (1997-05-01), None
patent: 2002-22617 (2002-01-01), None
patent: 2002-71447 (2002-03-01), None
patent: 2003-106946 (2003-04-01), None
patent: 2003-130763 (2003-05-01), None
patent: 2003-202276 (2003-07-01), None
patent: 2003-232674 (2003-08-01), None
patent: 2003-535755 (2003-12-01), None
patent: 2004-117092 (2004-04-01), None
patent: 2004-257836 (2004-09-01), None
patent: 2005-196156 (2005-07-01), None
Miyasaka Takanori
Mutoh Yasushi
Sahara Juntaro
Yamazoe Masanobu
Feliciano Eliseo Ramos
NSK Ltd.
Sughrue & Mion, PLLC
Suglo Janet L
LandOfFree
Abnormality diagnosing system for mechanical equipment does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Abnormality diagnosing system for mechanical equipment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Abnormality diagnosing system for mechanical equipment will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4147702