Electrophotography – Diagnostics
Reexamination Certificate
2007-04-10
2007-04-10
Nguyen, Vincent Q. (Department: 2858)
Electrophotography
Diagnostics
Reexamination Certificate
active
11020729
ABSTRACT:
An image forming apparatus is capable of specifying the type of an occurring abnormality to a certain extent while avoiding the increasingly complicated control that is cause when a plurality of abnormalities is detected individually according to the presence of their respective causes. A normal group data set, which is a collection of normal value combination relating to grouped information constituted by a plurality of information of differing types, is stored in RAM or ROM serving as information storage device of a control unit. At least two or more sets of grouped information, including first grouped information constituted by a plurality of different types of information, and second grouped information constituted by a plurality of information in a different combination to that of the first grouped information, are obtained from the RAM, the ROM, various sensors, and an operation display unit.
REFERENCES:
patent: 2005/0157327 (2005-07-01), Shoji et al.
patent: 5-100507 (1993-04-01), None
patent: 5-100517 (1993-04-01), None
patent: 5-281809 (1993-10-01), None
patent: 7-104616 (1995-04-01), None
patent: 8-30152 (1996-02-01), None
patent: 08-137344 (1996-05-01), None
patent: 2793419 (1998-06-01), None
patent: 2000-89623 (2000-03-01), None
patent: 2000-259222 (2000-09-01), None
patent: 2000-270141 (2000-09-01), None
patent: 2001-175328 (2001-06-01), None
patent: 2001-356655 (2001-12-01), None
patent: 2002-211090 (2002-07-01), None
patent: 2002-283683 (2002-10-01), None
patent: 2004-53944 (2004-02-01), None
U.S. Appl. No. 11/452,411, filed Jun. 14, 2006, Shoji et al.
U.S. Appl. No. 11/370,057, filed Mar. 8, 2006, Yamada et al.
U.S. Appl. No. 11/370,823, filed Mar. 9, 2006, Nakagawa et al.
U.S. Appl. No. 11/376,434, filed Mar. 16, 2006, Takahashi et al.
Genichi Taguchi, “Technical Developments in the MT System”, Japanese Standards Association Publication, pp. 1-466, (with English Abstract).
U.S. Appl. No. 11/156,552, filed Jun. 21, 2005, Nakagawa et al.
U.S. Appl. No. 11/167,821, filed Jun. 28, 2005, Nakazato et al.
U.S. Appl. No. 11/020,729, filed Dec. 27, 2004, Shoji et al.
U.S. Appl. No. 11/124,276, filed May 9, 2005, Miyahara et al.
U.S. Appl. No. 10/875,277, filed Jun. 25, 2004, Hisashi Shoji et al.
Hirai Shuji
Matsuura Nekka
Miyawaki Katsuaki
Nakagawa Yoshinori
Nakazato Yasushi
Nguyen Vincent Q.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Ricoh & Company, Ltd.
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