Abnormality detection apparatus for a power feed circuit

Electrical transmission or interconnection systems – Switching systems – Condition responsive

Reexamination Certificate

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C361S100000

Reexamination Certificate

active

11379591

ABSTRACT:
A single state detector circuit can quickly detect short-circuit and open-circuit abnormalities of a load controlled by a power transistor. A DC power supply, the load and the power transistor are serially connected with one another, so that a switching terminal voltage of the power transistor is binarized into high and low levels by the state detector. The power transistor is linearly controlled by a constant-current control circuit so as to suppress an excessive current, and power supplied to the power transistor is interrupted by an overheat interruption circuit. Upon occurrence of a short-circuit in the load during generation of an energization command, a switching terminal voltage of the power transistor becomes stabilized at a high level without intermittent operation, which is detected by the state detector. Upon occurrence of an open-circuit during generation of a deenergization command, a low switching terminal voltage is detected by the state detector.

REFERENCES:
patent: 5444595 (1995-08-01), Ishikawa et al.
patent: 08293414 (1996-11-01), None
patent: 2000312142 (2000-11-01), None

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