Abnormal shadow detecting method, abnormal shadow detecting...

Details Abnormal shadow detecting method, abnormal shadow detecting... Abnormal shadow detecting method, abnormal shadow detecting...

2008-01-29

2008-01-29

Azarian, Seyed (Department: 2624)

Image analysis

Applications

Biomedical applications

C382S274000, C378S037000

Reexamination Certificate

active

07324676

ABSTRACT:
Primary prospective abnormal shadow regions in images of objects are detected by different kinds of detecting processes. Whether or not the respective primary prospective abnormal shadow regions are of a desired abnormal shadow is determined by methods different from each other according to the kinds of processes by which the respective primary prospective abnormal shadow regions are detected. Only primary prospective abnormal shadow regions which are determined to be of a desired abnormal shadow are output as final prospective abnormal shadow regions.

REFERENCES:
patent: 5732121 (1998-03-01), Takeo et al.
patent: 5761334 (1998-06-01), Nakajima et al.
patent: 5768333 (1998-06-01), Abdel-Mottaleb
patent: 6272233 (2001-08-01), Takeo
patent: 6748044 (2004-06-01), Sabol et al.
patent: 7187789 (2007-03-01), Takeo
patent: 2002-109510 (2002-04-01), None

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