Abnormal pattern detection processing method and system

Image analysis – Applications – Biomedical applications

Reexamination Certificate

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C382S131000, C382S132000

Reexamination Certificate

active

09489846

ABSTRACT:
The result of detection processing by abnormal pattern detection processor means30is stored in a server40. In addition, the output image on an image output device440is read for pattern, and the supporting contents, such as the result of judgment by a doctor (which, when differing from the result of detection processing, corresponds to the corrected result), the comment, and the assessment category, are stored in the server40in conformity with the BI-RADS proposed by the ACR. The result of pathologic assessment corresponding to the abnormal pattern is related to the supporting contents and stored in the server40. The statistical processing in conformity with the follow-up method of the BI-RADS is performed to find the specificity, the cancer detection rate, etc.

REFERENCES:
patent: 5133020 (1992-07-01), Giger et al.
patent: 5583346 (1996-12-01), Nakajima
patent: 5761334 (1998-06-01), Nakajima et al.
patent: 5924074 (1999-07-01), Evans
patent: 6317617 (2001-11-01), Gilhuijs et al.
patent: 2002/0081006 (2002-06-01), Rogers et al.
patent: 10-233815 (1998-09-01), None
Fields et al., Clinical Evalution of Computerized Enhancement and Analysis of Mammographic Findings, 1996, Elsevier, Digital Mammography '96, pp. 81-86.
“Detection Method of Malignant Tumors in DR Images-Iris Filter”, Electronics Information Communication Society, D-II vol. J75-D-II No. 3, pp. 663-670, Mar. 1992.
“Extraction of Microcalcifications on Mammogram Using Morphological Filter with Multiple Structuring Elements”, Electronics Information Communication Society, D-II vol. J75-D-II No. 7, pp. 1170-1175, Jul. 1992.

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