Ablation probe with peltier effect thermal control

Details Ablation probe with peltier effect thermal control Ablation probe with peltier effect thermal control

2007-07-03

2007-07-03

Peffley, Michael (Department: 3739)

Surgery

Instruments

Electrical application

C606S020000, C606S021000

Reexamination Certificate

active

10802092

ABSTRACT:
A tissue ablation probe, system, and method are provided. The ablation probe comprises an elongated member, an ablative element mounted on the distal end of the elongated member, and at least one thermoelectric device mounted to the member in thermal communication with the ablative element. The system may include the ablation probe, thermal control circuitry for controlling the thermal effect of the thermoelectric device, and an ablation source for suppying ablation energy to the ablative element. A plurality of circumferentially distributed thermoelectric devices can be provided, so that radial tissue sectors can be selectively affected by independently controlling the thermal effect of the thermoelectric devices. In one embodiment, the thermoelectric device(s) can be used to cool a heat ablative element. In another embodiment, the thermoelectric device(s) can be used to heat an ablative element, thereby forming a heat ablative element. In still another embodiment, the thermoelectric device(s) can be used to cryogenically cool an ablative element, thereby forming a cryogenic ablative element.

REFERENCES:
patent: 4860748 (1989-08-01), Chiurco et al.
patent: 5139496 (1992-08-01), Hed
patent: 5529067 (1996-06-01), Larsen et al.
patent: 5735846 (1998-04-01), Panescu et al.
patent: 5755752 (1998-05-01), Segal
patent: 5779696 (1998-07-01), Berry et al.
patent: 5951546 (1999-09-01), Lorentzen
patent: 6196839 (2001-03-01), Ross
patent: 6212433 (2001-04-01), Behl
patent: 6379353 (2002-04-01), Nichols
patent: 6427089 (2002-07-01), Knowlton
patent: 6547783 (2003-04-01), Vilendrer et al.
patent: 6575967 (2003-06-01), LeVeen et al.
patent: 6685702 (2004-02-01), Quijano et al.
patent: 2003/0014098 (2003-01-01), Quijano et al.
patent: 2004/0079089 (2004-04-01), Wallach
PCT International Search Report for PCT/US2005/003588, Applicant: Boston Scientific Scimed, Inc., Forms PCT/ISA/210 and 220, dated Apr. 28, 2005 (9 pages).
PCT Written Opinion of the International Search Authority for PCT/US2005/003588, Applicant: Boston Scientific Scimed, Inc., Form PCT/ISA/237, dated Apr. 28, 2005 (4 pages).

Affiliated with

Also associated with

Rating

Ablation probe with peltier effect thermal control does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ablation probe with peltier effect thermal control, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ablation probe with peltier effect thermal control will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3742943