Aberrometer having reduced noise

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

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Details

C351S246000

Reexamination Certificate

active

07874674

ABSTRACT:
Methods and apparatus for facilitating determination of centroids of image spots in an image containing an array of image spots generated by an aberrometer, the image comprising a first plurality of pixels each pixel having a corresponding intensity value, the method comprising calculating an average intensity value for a second plurality of pixels in a perimeter around a pixel, the average calculated using a subset of the second plurality exclusive of at least a portion of the pixels in the perimeter.

REFERENCES:
patent: 4582863 (1986-04-01), Wessling
patent: 4925610 (1990-05-01), Wessling et al.
patent: 4929388 (1990-05-01), Wessling
patent: 4935164 (1990-06-01), Wessling et al.
patent: 5069820 (1991-12-01), Jen et al.
patent: 5160456 (1992-11-01), Lahn et al.
patent: 5456882 (1995-10-01), Covain
patent: 5476612 (1995-12-01), Wessling et al.
patent: 5567355 (1996-10-01), Wessling et al.
patent: 5720903 (1998-02-01), Wessling et al.
patent: 5721056 (1998-02-01), Wessling
patent: 5777719 (1998-07-01), Williams et al.
patent: 5779818 (1998-07-01), Wessling
patent: 5846606 (1998-12-01), Wessling
patent: 6086204 (2000-07-01), Magnante
patent: 6130419 (2000-10-01), Neal
patent: 6199986 (2001-03-01), Williams et al.
patent: 6264328 (2001-07-01), Williams et al.
patent: 6271915 (2001-08-01), Frey et al.
patent: 6299311 (2001-10-01), Williams et al.
patent: 6460997 (2002-10-01), Frey et al.
patent: 6497483 (2002-12-01), Frey et al.
patent: 6511180 (2003-01-01), Guirao et al.
patent: 6565209 (2003-05-01), Campin
patent: 6572230 (2003-06-01), Levine
patent: 6575572 (2003-06-01), Lai et al.
patent: 6595642 (2003-07-01), Wirth
patent: 6609794 (2003-08-01), Levine
patent: 6631991 (2003-10-01), Wirth
patent: 6632380 (2003-10-01), Wessling
patent: 6685320 (2004-02-01), Hirohara et al.
patent: 6715877 (2004-04-01), Molebny
patent: 6827444 (2004-12-01), Williams et al.
patent: 6948818 (2005-09-01), Williams et al.
patent: 7077522 (2006-07-01), Williams
patent: 7078665 (2006-07-01), Topa
patent: 7216980 (2007-05-01), Mihashi et al.
patent: 7249851 (2007-07-01), Hirohara et al.
patent: 7309126 (2007-12-01), Mihashi et al.
patent: 7335867 (2008-02-01), Topa
patent: 2003/0086063 (2003-05-01), Williams et al.
patent: 2004/0021826 (2004-02-01), Sarver et al.
patent: 2006/0044510 (2006-03-01), Williams et al.
patent: 2006/0126018 (2006-06-01), Liang
patent: 2006/0126019 (2006-06-01), Liang et al.
patent: 2006/0203198 (2006-09-01), Liang
patent: 08-259709 (1996-10-01), None
patent: WO 03/020167 (2003-03-01), None
patent: WO 2005/015290 (2005-02-01), None

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