Coded data generation or conversion – Analog to or from digital conversion – Analog to digital conversion
Reexamination Certificate
2006-09-07
2009-10-06
Mai, Lam T (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Analog to digital conversion
C341S155000
Reexamination Certificate
active
07598896
ABSTRACT:
An A/D converter comprises capacitors C1, C2, C3, C4, and C5coupled via a plurality of switches to a differential input/differential output amplifier1. The capacitor C5determines a gain of the amplifier1. A reset level is stored in the capacitor C1, and a signal level is stored in the capacitor C2. One terminal of the capacitor C1and one terminal of the capacitor C2are coupled to the respective differential inputs, and the other terminals of the capacitors C1, C2are coupled to each other, whereby the amplifier1generates a difference signal between the reset level and the signal level. The cyclic A/D conversion of this difference signal is performed by switching the capacitors C1, C2, C3, and C4coupled via a plurality of switches to the differential-input/differential-output amplifier1, thereby obtaining an A/D conversion value with reduced random noise.
REFERENCES:
patent: 5212486 (1993-05-01), Nagaraj
patent: 6128039 (2000-10-01), Chen et al.
patent: 6535157 (2003-03-01), Garrity et al.
patent: 7345615 (2008-03-01), Kawahito
patent: 2001-053610 (2001-02-01), None
patent: 2003-158432 (2003-05-01), None
patent: 2005-136540 (2005-05-01), None
patent: 2006-025189 (2006-01-01), None
Steven Decker et al., “A 256×256 CMOS Imaging Array with Wide Dynamic Range Pixels and Column- Parallel Digital Output,” IEEE J. Solid-State Circuits, vol. 33, No. 12, Dec. 1998 (pp. 2081-2091).
Nobuhiro Kawai and Shoji Kawahito, “Noise Analysis of High-Gain, Low-Noise Column Readout Circuits for CMOS Image Sensors,” IEEE Trans. Electron Devices, vol. 51, No. 2, Feb. 2004 (pp. 185-194).
Mitsuhito Mase, Shoji Kawahito, Masaaki Sasaki and Yasuo Wakamori, “A 19.5b Dynamic Range CMOS Image Sensor with 12b Column-Parallel Cyclic A/D Converters,” 2005 IEEE Int'l Solid-State Circuits Conference, Digest of Technical Papers, Feb. 6, 2005 (pp. 350, 351, 603).
International Search Report for PCT/JP2006/317772, Form PCT/ISA/210, completed Nov. 7, 2006 (1 sheet).
Translation of International Preliminary Report on Patentability for PCT/JP2006/31772, Forms PCT/IB/338, PCT/IB/373 and PCT/ISA/237, issued Mar. 11, 2008 (5 sheets).
Mai Lam T
National University Corporation Shizuoka University
Squire Sanders & Dempsey L.L.P.
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