A/D converter using resistor ladder network and method of testin

Details A/D converter using resistor ladder network and method of testin A/D converter using resistor ladder network and method of testin

1995-05-30

1997-08-26

Gaffin, Jeffrey A.

Coded data generation or conversion

Converter calibration or testing

341156, 341158, 341159, H03M 110

Patent

active

056614810

ABSTRACT:
An A/D converter and a method of testing the same. Resistors R1 to Rn are connected in series between power-supply terminals receiving a high potential and a low potential, respectively. The potentials at the nodes of the resistors R1 to Rn are input to voltage comparators C1 to Cn-1, respectively. Each comparator compares the input potential with an input signal Vin. The output signals of comparator is supplied to an encoder. The encoder converts the input signals into a digital signal. A test terminal is connected to one of the nodes of the resistors R1 to Rn. Either the high potential at the terminal or the low potential at the terminal is applied to the test terminal to test the A/D converter.

REFERENCES:
patent: 4903028 (1990-02-01), Fukushima
patent: 5124704 (1992-06-01), Kase et al.
patent: 5182560 (1993-01-01), Shiwaku
Data Book, Analog Devices Co., May 1988, AD9002, pp. 11-297 to 11-302 (translation was not provided) (the reference is in Japanese).

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