Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-04-17
1990-04-17
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324690, G01R 2726
Patent
active
049183761
ABSTRACT:
A compensated capacitive probe system in which the probe and a guard ring are placed in the feedback path of an operational amplifier. An input signal is applied to the operational amplifier in combination with a portion of the guard signal. The resulting configuration compensates for stray capacitance at a measuring electrode of the probe and for the fact that the operational amplifier is other than mathematically ideal.
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Mallory Roy S.
Poduje Noel S.
ADE Corporation
Eisenzopf Reinhard J.
Regan Maura K.
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