Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2011-03-08
2011-03-08
Wells, Nikita (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S492100, C398S141000, C398S180000, C398S189000, C359S326000
Reexamination Certificate
active
07902526
ABSTRACT:
An imaging system is provided that includes a optical pulse generator for providing an optical pulse having a spectral bandwidth and includes monochromatic waves having different wavelengths. A dispersive element receives a second optical pulse associated with the optical pulse and disperses the second optical pulse at different angles on the surface of the dispersive element depending on wavelength. One or more focal elements receives the dispersed second optical pulse produced on the dispersive element. The one or more focal element recombine the dispersed second optical pulse at a focal plane on a specimen where the width of the optical pulse is restored at the focal plane.
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Kim et al., “Axial resolution for two-photon wide-field illumination microscopy and microfabrication” Multiphonon Microscpoy in Biomedical Sciences VIII, Edited by Ammasai Periasamy, Peter T.C.: Proc. of SPIE, 2008, vol. 6860, 68028-1˜686028-7.
Kim Daekeun
So Peter T. C.
Gauthier & Connors LLP
Massachusetts Institute of Technology
Wells Nikita
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