4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis
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Chohata Kazuaki

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Church Craig

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Church Graig E.

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Cohen Isadore

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Cole John H.

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Commonwealth Scientific and Industrial Research

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Conley Raymond P.

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Connor Dean

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Control Screening, LLC.

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Crane Keith

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Croft Mark C.

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Crowther David J.

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