4. Thermal measuring and testing
  5. Temperature measurement
  6. In spaced noncontact relationship to specimen
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Saikawa Shinichi

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Samulski Thaddeus V.

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Sandoe Iain D.

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Sato Ayahiko

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Sawada Shigetomo

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Scharf Vered

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Scharf Wayne

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Schmidt Volker

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Schuele Georg

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Schultheis Lothar

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Schweitzer Marc

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Scorer Michael

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Seelin Kusuma S.

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Seelin Srikanth N.

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Seelink Technology

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SempriMoschnig Christoph

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Shestopalov Alexandr A.

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Shie Jin-Shown

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Shigeoka Takashi

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Shiohara Yasuhiro

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