LandOfFree - US Patents - Listing for Thermal measuring and testing,Leak or flaw detection,With heating or cooling of specimen for test

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Seddon Kevin J

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Seki Juntaro

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Siltron Inc.

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Somafer

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Southwick Russell D.

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Spalding, Jr. John F.

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Storset Magnar K.

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Takehara Kimio

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Tufano Giovanni

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Veronesi William A.

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Wee Sang-Wook

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Welch Christopher

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Wells Clifford G.

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White, III John D.

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Winfree William P.

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Yagi Tomikazu

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Yano Taizo

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Zalamedia Joseph N.

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Zhang Zhiguo

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