4. Thermal measuring and testing
  5. Leak or flaw detection
  6. With heating or cooling of specimen for test
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Gilchrist George William

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Halsor Svein R.

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Heyman Joseph S.

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Higgins Euel V.

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Hirashima Toru

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Interuniversitair Micro-Electronika Centrum vzw

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Ishida Shunichiro

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Kadoura Hiroaki

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Kempa Krzysztof

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Kendall Gay

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Kim Kwang-Salk

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Koshihara Toshio

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Kuhn Gabriel M.

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Le Poutre Francois

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Legrandjacques Laurent

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Lesniak Jon R.

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Limburgs Universitair Centrum

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Litovsky Roman

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Lyden Henry A.

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Machak David R.

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