Bamberg Walter H.
Barats Jury M.
Bareiss Martin
Barr Michael C.
Baumann Daniel Guy
BEI Sensors & Systems, Inc.
Belk Daniel James
Bertsch Peter K.
Boenig James Michael
Boreas Inc.
Bowman Lyn
Bradshaw Thomas W.
Britcliffe Michael J.
Broche Jacques
Brown & Michaels PC
Browning Calvin W.
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Byoung-Moo Lee
Byung-Mu Lee