Bakke Rune
Bielski Roman
Blatchley Charles C.
Daellenbach Charles B.
Dubail Alain
Dzierzynski Puaul M.
Geidis Ulrich
Jones Christopher David
Krisst Raymond John
Loffel Rudi
Mahan Warren M.
mic measuring ideas consulting GmbH
Peterson Jr. Charles W.
Pretron Electronics Pty. Ltd.
Schulcz Francis
Siebel Maarten A.
Stubbs Raymond F.
Volpe and Koenig, P.
Watt John S.
Watt John Stanley