4. Optics: measuring and testing
  5. Shape or surface configuration
  6. Triangulation
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Magna Electronics Inc.

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Malione Michael

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Mathy Cecile

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Matsunaga Norio

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McCleave Barry W.

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Metris IPR N.V.

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Metron Systems, Inc.

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Mitic Jelena

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Moctezuma de la Barrera José Luis

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Moon Yu-Hyun

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MPT Präzisionstelle GmbH

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Mukai Takayuki

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Munstermann Peter

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Murray Don

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