LandOfFree - US Patents - Listing for Optics: measuring and testing,Material strain analysis,By light interference detector

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Tenjimbayashi Koji

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Theriault John P.

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Tien Chuen-Lin

Inventor

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Toyooka Satoru

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Tyson, II John

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Udd Eric

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Viel Terrence E.

Inventor

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Walker Colin A.

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Watanabe Steven F.

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Webster John M.

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Windeler Stanley R.

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Wolf Russell C.

Examiner

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Xiao Hai

Inventor

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Yegorushkin Valery E.

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Yoshida Sanichiro

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You Hsien-I

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Zuev Lev B.

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