4. Optics: measuring and testing
  5. Inspection of flaws or impurities
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Schramm William J

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Schumann Stephen A.

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Schunck Gunter

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Schurch Georg

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Schurr George

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Schwartz Gilad

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Schwartz Mark H.

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Schweiger Michael

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Schweitzer Charles F.

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Schwindt Christian J.

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Scientific Technologies, Inc.

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Sebeny Carl E.

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Seethaler Bernd Franz

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Seh-America, Inc.

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Seidel Daniel J.

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Seiren Denshi Kabushiki Kaisha

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Seitz Peter Markus

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Sekine Yoshitada

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Semiconductor Technologies & Instruments, Inc.

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Senoo Shigeo

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