4. Optics: measuring and testing
  5. Inspection of flaws or impurities
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Scientific Technologies, Inc.

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Sebeny Carl E.

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Seethaler Bernd Franz

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Seh-America, Inc.

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Seidel Daniel J.

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Seiren Denshi Kabushiki Kaisha

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Seitz Peter Markus

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Sekine Yoshitada

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Semiconductor Technologies & Instruments, Inc.

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Senoo Shigeo

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Seong Nagkeun

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Sevigny Kevin M.

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Shabde Sunil N.

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Shaber Gary S.

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Shaw Eugene L.

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Shear Graphics, LLC

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Shearographics, LLC

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Shen Wei-Ning

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Shepherd William T.

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Sherwood Lyle

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