Advanced Metrology Systems LLC
AEW International Limited
Akishiba Yuji
Allocca Gene P.
ALSTROM Technology Ltd.
Altukoff Leo N.
AMO Wavefront Sciences, LLP
Angellier Cedric
AOI Foils Limited
AU Optronics Corp
Ausschnitt Christopher
Balasubramanian Raghu
Bales Jennifer L
Balzers Leybold Optics GmbH
Banke, Jr. G. William
Bao Junwei
Barker Lawrence D.
Beckman Rudolf
Beining Adrian
Bender Douglas