LandOfFree - US Patents - Listing for Optics: measuring and testing,By polarized light examination,Of surface reflection

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K-MAC

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Kabashin Andrei

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Karonen Aimo

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Kitamura Fujikazu

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KLA-Technologies Corporation

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KLA-Tencor Corp. Technologies

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Klein David L.

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Ko Young June

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Kouns Charles W.

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Krishnan Shakar

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Kruger Albrecht

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Kueny Andrew W.

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Kwak Hidong

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