4. Optics: measuring and testing
  5. By configuration comparison
  6. With photosensitive film or plate
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Makihara Hiroshi

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Makkonen Tapio

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Mangat Pawitterjit S.

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Maris Humphrey J.

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Mectron Engineering Company

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Meeks Steven W.

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Meredith, Jr. William A.

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Micro-Controle

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Miller, Jr. Warren H.

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Mitsui Mining & Smelting Co. Ltd.

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Mochida Yoshihiro

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Moga Leo J.

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Mondie George Randolph

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Muller Richard C.

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Mundt Randall

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Munford James A.

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Munkes Dieter

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