LandOfFree - US Patents - Listing for Measuring and testing,Surface and cutting edge testing,Roughness

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Hitachi Electronic Engineering Co., Ltd.

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Hlady Vladimir

Inventor

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Ho Kian Seng

Inventor

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Hobbs Jamie Kayne

Inventor

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Hoh Jan H.

Inventor

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Homma Akihiko

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Hong Jaewan

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Honma Akihiko

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Honma Katsunori

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Houge Erik C.

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Houge Erik Cho

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Houston Jack E.

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Howard Lowell P.

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Hu Jun

Inventor

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Hung Shao-Kang

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Huydts Eduard J. C.

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Hwang Kyu Ho

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Hysitron Incorporated

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