4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element
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Nanseki Kenji

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Nas-Toa Co., Ltd.

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Natarajan Balaji

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Nathan Arokia

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National Applied Research Labratories

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National Semiconductgor

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National Semiconductor Corp. Inc.

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National University Corporation Tohoku University

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Naujoks Adolph C.

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Navish, Jr. Francis W.

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Navratil Peter

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Nayak Neeraj P.

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Nazarov Elena

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nCHIP, Inc.

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Neaves Philip

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NEC Machinery Corporation

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Neeb James

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Neeb James Edward

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Neeb Jim

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Needham Wayne M.

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