4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation
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Righi John M.

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Rivkin Steven Neal

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Robbins, III Sanford H.

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Rockwell Paul

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Rosen-Zvi Michal

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Ruemer Robert

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Rydquist Gordon K.

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Ryker Gregory G.

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Sakai Hidetaka

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Sakayori Masahiko

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Salnik Alexei

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Sandoval Francisco Bautista

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Satya Akella V.S.

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Savory John

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Schmitt Edward A.

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Seale James W.

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Sekiguchi Takuaki

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Shen Colin Ong Li

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Shen You-Wei

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Sheth Pranav

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