4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
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Sarma C. Surya Prakash

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Sasselli Roy A.

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Sassi William

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Satyamurthy Chintamani

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Satyanarayana Hari Venkata Subrahmanya

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Savini Luca

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Scannell Joseph P.

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Schenkel Clifford

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Scherer Perry W.

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Schilke Christina

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Schlumberg Technology Corporation

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Schneider, Jr. William A.

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Schnell Ryan W-M.

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Schoen Juergen S.

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Schonewille Michel Albert

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Schroeder Timothy A.

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Schroedter Marion

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Schwartzbard Alan E.

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Schweller William J.

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Schweller William John

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