4. Coating processes
  5. Fraud or tamper detecting
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Maier Michael C.

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Maki Tooru

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Malandain Michel

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Masson Claudine J. C.

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Maurer Pierre

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Melliger Guido W.

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Michaelis Arthur F.

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Microtrace, Inc.

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Minemura Katsuyoshi

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Miyamoto Yosuke

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Moore Steven Jerome

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Morrow Kenneth L.

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