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Three-dimensional color and shape measuring device

Optics: measuring and testing – Plural test
Reexamination Certificate

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Time and space resolved standoff hyperspectral IED...

Optics: measuring and testing – Plural test
Reexamination Certificate

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Wafer shape accuracy using symmetric and asymmetric...

Optics: measuring and testing – Plural test
Reexamination Certificate

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Wafer thickness measuring apparatus and detection method...

Optics: measuring and testing – Plural test
Reexamination Certificate

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