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Second harmonic analyzer

Optics: measuring and testing – Crystal or gem examination
Patent

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Semiconductor substrate, method of manufacturing semiconductor s

Optics: measuring and testing – Crystal or gem examination
Patent

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Sensing a narrow frequency band and gemstones

Optics: measuring and testing – Crystal or gem examination
Patent

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Sensing a narrow frequency band of radiation and gemstones

Optics: measuring and testing – Crystal or gem examination
Patent

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System for characterizing semiconductor materials and photovolta

Optics: measuring and testing – Crystal or gem examination
Patent

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System for identifying jewels

Optics: measuring and testing – Crystal or gem examination
Patent

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Systems and methods for evaluating the appearance of a gemstone

Optics: measuring and testing – Crystal or gem examination – Axes determination
Reexamination Certificate

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Systems, apparatuses and methods for diamond color...

Optics: measuring and testing – Crystal or gem examination
Reexamination Certificate

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