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Process for the double-sided exposure of a semiconductor or subs

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Patent

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Processes and devices enabling the entry of a target into a...

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Programmable scanner/tracker

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Projectile tracking system

Optics: measuring and testing – Angle measuring or angular axial alignment – Automatic following or aligning while indicating measurement
Patent

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Projectile tracking system

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Projection of two orthogonal reference light planes

Optics: measuring and testing – Angle measuring or angular axial alignment
Patent

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Protective apparatus for the monitoring of a protected zone...

Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Reexamination Certificate

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Pseudo gyro

Optics: measuring and testing – Angle measuring or angular axial alignment – Star/sun/satellite position indication with photodetection
Patent

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Pull-through structure for measuring the curvature of the intern

Optics: measuring and testing – Angle measuring or angular axial alignment
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Pulsed polarization device for measuring angle of rotation

Optics: measuring and testing – Angle measuring or angular axial alignment
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