Probeable substrate substitute for a calibration standard and te

Details Probeable substrate substitute for a calibration standard and te Probeable substrate substitute for a calibration standard and te

1992-10-02

1995-12-19

Nguyen, Vinh P.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

333246, G01R 1910

Patent

active

054771374

ABSTRACT:
A method and apparatus for a probeable substrate substitute for a calibration standard and test fixture. The probestrate includes a dielectric substrate having first and second dielectric substrate surfaces and at least one conductive via hole through the dielectric substrate from the first dielectric substrate surface to the second dielectric substrate surface. A first metalized layer is in contact with the first dielectric substrate surface and the at least one conductive via hole. A second metalized layer is in contact with a first portion of the second dielectric substrate surface and with the at least one conductive via hole. The first and second test ports contact a second portion of the second dielectric substrate surface. An electronic device can be connected to the first and second test ports with bond wires for characterization via contact of the first and second test ports with standard test station equipment.

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