Multi-wavelength programmable laser processing mechanisms and ap

Details Multi-wavelength programmable laser processing mechanisms and ap Multi-wavelength programmable laser processing mechanisms and ap

1995-06-06

1998-05-12

Elmore, Reba I.

Boots, shoes, and leggings

36447408, 2191217, 21912174, G06F 1900, G06G 764, G06G 766

Patent

active

057515883

ABSTRACT:
A desired design for electronic structures is converted into a graphic design format and sorted into a pseudo-raster format corresponding to scan lines. A laser or other machining beam is controlled by a separate tracking beam utilizing a mid-objective scanning system. The firing frequency of the machining beam is determined by the position of the tracking beam on a detector, as compared to the scan line data. Accuracy is verified by detection of plume or spectra generated during machining. Alignment of the machining and tracking beams is by interferometric methods. The system improves optical performance parameters of telecentricity, angle of scanned beam line, location of line in which the scanned line resides, astigmatism and field curvature.

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