Method and apparatus for high frequency time domain reflectometr

Details Method and apparatus for high frequency time domain reflectometr Method and apparatus for high frequency time domain reflectometr

1995-12-08

1998-05-12

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324534, 324535, 324642, 324644, G01R 3111

Patent

active

057511497

ABSTRACT:
An apparatus and method is disclosed for the location of faults occurring within transmission systems. The disclosed apparatus and method allows a user to adjust the center frequency of a pulse output by a standard narrow bandwidth time domain reflectometer, without altering the bandwidth of the output pulse. As a result, the detection of faults occurring at a wide range of frequencies is enabled--while the cost associated with widening the bandwidth of the transmitted pulse is not incurred. Moreover, due to the narrower bandwidth, efficient fault detection is achieved as well for high frequency systems as for low frequency systems.

REFERENCES:
patent: 3470331 (1969-09-01), Barash
patent: 3600674 (1971-08-01), Roberts
patent: 3753086 (1973-08-01), Shoemaker
patent: 4404514 (1983-09-01), Reichert
patent: 5144250 (1992-09-01), Little

Affiliated with

Also associated with

Rating

Method and apparatus for high frequency time domain reflectometr does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for high frequency time domain reflectometr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for high frequency time domain reflectometr will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-984272